|
|
Chemical
Analysis
Expert
Testimony
Failure
Analysis
Health &
Beauty
Materials
Expertise
Mechanical
& Physical Testing
Microbiology
Microscopy
Packaging
Analysis
Patent
Infringement
Petroleum
Testing
Pipe Rehab
Plastic Piping
Systems
Polymers
& Plastics
Product
Expertise
Product
Liability
Technical
Equipment
|
|
|
Microscopy
Hauser Laboratories uses
scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS)
to help solve a wide range of problems. This is augmented by optical
microscopy and image-handling systems.
With SEM, we characterize fractures in ceramics, metals, plastics, and
composites - an important part of many failure analysis problems. These types
of analyses are particularly useful in legal cases and insurance claims. We
also determine the type and amount of surface contamination on printed circuit
boards, connectors, fractures, food products, and medical components using
the EDS in conjunction with the SEM.
SEM can provide a detailed assessment of the surface topography of products
such as paint, powders, rubber, tapes, filters, fibers, natural products,
catalysts, and particulates at magnifications to 20,000 or greater. Hauser
Laboratories uses SEM to measure fibers, particles, microballoons,
and similar small objects.
Localized corrosion can be examined and the corrosion products identified using
SEM/EDS. We examine cross-sections to accurately measure coating thickness, hole sizes, gaps between components or joined articles,
and variations that occur in manufactured items.
Using EDS X-ray analyses, we determine the presence of diffusion, bridging,
or epitaxial growth on printed circuit boards and
the migration of selected metals or precipitates in alloys or dissimilar
metal assemblies. Using X-ray mapping techniques, Hauser Laboratories
personnel can trace and define dilution effects in weldments
and precipitation or other phenomena that occur in the weld heat-affected
zones.
Send mail to company Webmaster with questions or comments
about this web site.
|